Conveners
Techniques I
- Tetsuya Ishikawa (RIKEN SPring-8 Center)
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Prof. Yoshinori Nishino (Research Institute for Electronic Science, Hokkaido University)26/11/2015, 14:15Beamlines, Instrumentation and TechniquesOralCoherent diffractive imaging (CDI) is a growing technique in photon science. In CDI, sample images are numerically reconstructed from the coherent diffraction data without the need for objective lenses. CDI is thus advantageous for X-rays, for which high-magnification objective lenses are difficult to fabricate. CDI has been demonstrated to be a powerful tool in visualizing cells and...Go to contribution page
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Dr Sangsul Lee (Pohang Accelerator Laboratory, POSTECH)26/11/2015, 14:45Beamlines, Instrumentation and TechniquesOralThe synchrotron-based hard X-ray nanotomography beamline, named X-ray Nano Imaging (XNI), has been established since 2011 at sector 7C of Pohang Light Source-II (PLS-II). The XNI beamline was constructed primarily as a full-field X-ray microscopy for the inner structures study of biology and material science. Normal operation mode provides 46 nm resolution for still images and 100 nm...Go to contribution page
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Dr Sam Yang (CSIRO)26/11/2015, 15:05Beamlines, Instrumentation and TechniquesOralQuantitative and sample-non-destructive (SND) characterization of 3D microscopic composition distribution in materials is important in a broad range of R&D disciplines. The X-ray CT and image threshold segmentation approach has been widely used. Nevertheless, it imposes a length-scale cut-off at the X-ray CT resolution limit, which would limit its usefulness for materials with...Go to contribution page
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Dr Michael Jones (Australian Synchrotron)26/11/2015, 15:25Beamlines, Instrumentation and TechniquesOralThe XFM beamline at the Australian Synchrotron typically operates in the backscatter geometry using the Maia detector and fast scanning stages, allowing rapid and efficient collection of fluorescent X-ray photons. In most cases, the transmitted beam is collected by a photodiode to give at best a poor measure of the thickness of the specimen. However, the transmitted beam carries much more...Go to contribution page