Line Profile and Microstructure Analysis using Powder Diffraction

The analysis of X-ray powder diffraction data can reveal important information about microstructure such as crystallite size and strain, which have been traditionally characterised using models with very limited application due to assumptions made during their derivation.  These assumptions can often misrepresent the sample analysis leading to poor model agreement and in worse cases, inaccurate results and reporting.  Modern microstructural analysis methods use more sophisticated mathematical models to describe a range of observed phenomena in X-ray powder diffraction data such as peak broadening due to small crystallite size, micro-strain, combined size/strain effects, stacking faults, anti-phase boundaries and grain surface relaxation.

Australian Synchrotron’s Powder Diffraction team in conjunction with the Australian X-ray Analytical Association (AXAA) are excited to welcome Professor Matteo Leoni from the University of Trento, an expert in Line Profile Analysis (LPA), to run the workshop “Line Profile and Microstructure Analysis using Powder Diffraction”.  Professor Leoni was part of the team that wrote the software package PM2K that provides modern analysis methods for line profile and microstructure analysis.  The workshop is aimed at the moderate-to-advanced powder diffraction analysis user who is required to model complex microstructural effects.  The single day event will consist of lectures and hands-on tutorials where participants are encouraged to bring their own data.   

Please complete the registration form if you are interested in attending the workshop.